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Proceedings Paper

Testing and results of an infrared polarized scene generator concept demonstrator
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Paper Abstract

Polarization signature information is becoming more useful as an added discriminant in a variety of signature analysis applications. However, there are few infrared scene projection systems that provide the capability to inject target simulation images with polarization content into a seeker, or other imaging sensor. In this paper, we discuss a polarization scene generator (PSG) concept that is applicable to testing sensor systems operating in cryogenic-vacuum environments. This polarization scene generator concept demonstrator system was constructed from off-the-shelf technology using commercially available mid-wave infrared (MWIR) scene projectors based on micromirror device display technology, standard infrared polarizers, and standard IR cameras. The demonstrator system used two digital micromirror device (DMD)-based displays, each projecting orthogonal polarization states, which were then combined to generate images with pixels having independent S1 or S2 polarization content. This concept is robust because it is relatively unconstrained by the IR scene generators used or by the seekers tested. This paper discusses the test results of the concept demonstrator system with regard to sensitivity to misalignment, radiance mismatch, and display uniformity.

Paper Details

Date Published: 16 April 2008
PDF: 11 pages
Proc. SPIE 6942, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIII, 69420D (16 April 2008); doi: 10.1117/12.778049
Show Author Affiliations
Peter S. Erbach, Polaris Sensor Technologies, Inc. (United States)
J. L. Pezzaniti, Polaris Sensor Technologies, Inc. (United States)
David B. Chenault, Polaris Sensor Technologies, Inc. (United States)
Danny Saylor, Optical Sciences Corp., Inc. (United States)
Heard S. Lowry, Aerospace Testing Alliance (United States)

Published in SPIE Proceedings Vol. 6942:
Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XIII
Robert Lee Murrer Jr., Editor(s)

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