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Proceedings Paper

A compact optical ethylene monitoring system
Author(s): J. Wöllenstein; S. Hartwig; J. Hildenbrand; Andre Eberhardt; M. Moreno; J. Santander; R. Rubio; J. Fonollosa; L. Fonseca
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Paper Abstract

In various fruit storage applications precise and continuous ethylene detection is needed. The aim of this work is the development of a miniaturised mid-infrared filter spectrometer for ethylene detection at 10.6 &mgr;m wavelength. For this reason optical components and signal processing electronics were developed, tested and integrated in a compact measurement system. The present article describes the optical components, the integration of the optical system, electronics and results of gas measurements. Next to a Silicon-based macroporous IR-emitter, a miniaturised absorption cell and a detector module for the simultaneous measurement at four channels for ethylene, two interfering gases and the reference signal were integrated in the optical system. Optical filters were attached to fourfold thermopile-arrays by flip-chip- technology. Silicon-based Fresnel multilenses were processed and attached to the cap of the detector housing. Because of the high reflection losses at the silicon-air surface the Fresnel lenses were coated with Antireflection layers made of Zinc sulphide. For the signal processing electronics a preamplification stage and a Lock-in-board has been developed. First ethylene measurements with the optical system with miniaturised gas cell, Silicon-based IR-emitter, a commercial thermopile detector and the self-developed system electronics showed a detection limit of smaller than 20ppm.

Paper Details

Date Published: 15 May 2007
PDF: 10 pages
Proc. SPIE 6589, Smart Sensors, Actuators, and MEMS III, 658907 (15 May 2007); doi: 10.1117/12.721822
Show Author Affiliations
J. Wöllenstein, Fraunhofer Institute for Physical Measurement Techniques (Germany)
S. Hartwig, Fraunhofer Institute for Physical Measurement Techniques (Germany)
J. Hildenbrand, Fraunhofer Institute for Physical Measurement Techniques (Germany)
Andre Eberhardt, Fraunhofer Institute for Physical Measurement Techniques (Germany)
M. Moreno, Univ. de Barcelona (Spain)
J. Santander, Ctr. Nacional de Microelectrónica (Spain)
R. Rubio, Ctr. Nacional de Microelectrónica (Spain)
J. Fonollosa, Univ. de Barcelona (Spain)
L. Fonseca, Ctr. Nacional de Microelectrónica (Spain)

Published in SPIE Proceedings Vol. 6589:
Smart Sensors, Actuators, and MEMS III
Thomas Becker; Carles Cané; N. Scott Barker, Editor(s)

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