Proceedings Paper
Comparative analysis of histological results of visible lesion thresholds for thermal and LIB induced skin damage at 1.3 μm and 1.5 μm| Format | Member Price | Non-Member Price |
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Paper Abstract
An assessment of skin damage caused by near-IR laser exposures is reported. The damage from two distinct laser-tissue temporal regimes is compared at two wavelengths (1.3 &mgr;m and 1.5 &mgr;m). Skin damage caused by thermal effects from single laser pulses is compared to damage caused by LIB (laser induced breakdown) using histological examinations. Modeling applications are explored to determine crossover points between thermal and photomechanical damage thresholds.
Paper Details
Date Published: 6 February 2007
PDF: 10 pages
Proc. SPIE 6435, Optical Interactions with Tissue and Cells XVIII, 643504 (6 February 2007); doi: 10.1117/12.700405
Published in SPIE Proceedings Vol. 6435:
Optical Interactions with Tissue and Cells XVIII
Steven L. Jacques; William P. Roach, Editor(s)
PDF: 10 pages
Proc. SPIE 6435, Optical Interactions with Tissue and Cells XVIII, 643504 (6 February 2007); doi: 10.1117/12.700405
Show Author Affiliations
Justin J. Zohner, AFRL/HEDO (United States)
David J. Stolarski, Northrop Grumman (United States)
Ginger M. Pocock, AFRL/HEDO (United States)
Jerry R. Cowart D.V.M., AFRL/HEDV (United States)
Clifton D. Clark III, Northrop Grumman (United States)
David J. Stolarski, Northrop Grumman (United States)
Ginger M. Pocock, AFRL/HEDO (United States)
Jerry R. Cowart D.V.M., AFRL/HEDV (United States)
Clifton D. Clark III, Northrop Grumman (United States)
Robert J. Thomas, AFRL/HEDO (United States)
Clarence P. Cain, Northrop Grumman (United States)
Semih S. Kumru, AFRL/HEDO (United States)
Benjamin A. Rockwell, AFRL/HEDO (United States)
Clarence P. Cain, Northrop Grumman (United States)
Semih S. Kumru, AFRL/HEDO (United States)
Benjamin A. Rockwell, AFRL/HEDO (United States)
Published in SPIE Proceedings Vol. 6435:
Optical Interactions with Tissue and Cells XVIII
Steven L. Jacques; William P. Roach, Editor(s)
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