Share Email Print

Proceedings Paper

One method to monitor the PPD function of Nikon scanners and some reticle surface particle detection machines
Author(s): Wei-Han Yang; Ying-Ku Lin; C. C. Huang
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

In the lithography process, if particles fall on the reticle, it will cause frame defocus, abnormal CD, bin fail ,and even low yield after exposure. This issue is more and more important in 90nm, 60nm, and 45nm processes.Nikon scanners have a pellicle particle detector (PPD) function that detects particles on the reticle surface before and after exposure. But how do you make sure the PPD function is working? And is the PPD sensitivity what you want? Until now, there has been no method to monitor this issue. Even Nikon and other mask shops could not provide a monitoring method.We offer an easy method that not only makes sure that the PPD function is working, but also monitors the sensitivity you want. The method is to make a monitor reticle by laying a hair on the reticle surface. If the position on the reticle with a hair triggers all alarms with C grade during PPD examination, we say this PPD function is ready because the width of the hair is about 75 um, and this is just the desired size.

Paper Details

Date Published: 15 March 2006
PDF: 11 pages
Proc. SPIE 6154, Optical Microlithography XIX, 61542H (15 March 2006); doi: 10.1117/12.653008
Show Author Affiliations
Wei-Han Yang, United Microelectronics Corp. (Taiwan)
Ying-Ku Lin, United Microelectronics Corp. (Taiwan)
C. C. Huang, United Microelectronics Corp. (Taiwan)

Published in SPIE Proceedings Vol. 6154:
Optical Microlithography XIX
Donis G. Flagello, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?