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Proceedings Paper

Application of near infrared spectroscopy to predict plant diseases
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Paper Abstract

The objectives of this study were to characterize leaf reflectance spectra of tomato leaves damaged by leaf miner and to determine those leaf reflectance wavelengths that were most responsive to plant damage caused by the pest. Near infrared (NIR) Spectral characteristics of single tomato leaves at various levels of infestation by the leaf miner, were measured and analyzed using a spectrometer. Tomato leaf damage was classified into five scales, i.e., 0 (no damage), 1 (light damaged), 2 (10-25% damaged), 3 (more than 25% damaged), and 4 (severe damaged), based on the scale of infestation displayed on the surfaces of plant parts. Spectral parameter such as reflectance sensitivity was used to find the optimal wavelengths to determining and evaluating the damage level. Results showed that there were significant differences in reflectance among infestations at wavelengths of 1450nm and 1900 nm particularly. The determining coefficients (R2) for a linear relationship were 0.98 and 0.91 for the spectral-infestation levels relations. Thus, both of these wavelengths were good indicators of leaf senescence caused by the leaf miner.

Paper Details

Date Published: 8 November 2005
PDF: 9 pages
Proc. SPIE 5996, Optical Sensors and Sensing Systems for Natural Resources and Food Safety and Quality, 59960A (8 November 2005); doi: 10.1117/12.628458
Show Author Affiliations
Huirong Xu, Zhejiang Univ. (China)
Yibin Ying, Zhejiang Univ. (China)
Zunzhong Ye, Zhejiang Univ. (China)

Published in SPIE Proceedings Vol. 5996:
Optical Sensors and Sensing Systems for Natural Resources and Food Safety and Quality
Yud-Ren Chen; George E. Meyer; Shu-I Tu, Editor(s)

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