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Proceedings Paper

Synthesis and manufacturing the mirrors for ultrafast optics
Author(s): Vladimir Pervak; Sergey Naumov; Gabriel Tempea; Vlad Yakovlev; Ferenc Krausz; Alexander Apolonski
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Paper Abstract

Properties of 3 types of multilayer dielectric chirped mirrors manufactured with Helios Leybold system (magnetron sputtering with plasma/ion assisted technology) are discussed. The first type includes mirrors providing negative group delay dispersion (GDD) and high reflectance in a wavelength range 650-1150 nm. Such mirrors are used in a broadband Ti:Sapphire oscillator for generating sub-6 femtosecond pulses. The second type of mirrors has extremely low both GDD oscillations and losses in a range 740-840 nm. Such mirrors are of interest for both long-cavity high-energy Ti:Sapphire oscillators and so-called external cavities for storing energy from femtosecond oscillators. The lowest residual GDD fluctuations achieved for this type of mirrors are 5 fs2. The third type is high reflectors with very high reflectivity. Different coating materials: Nb2O5, TiO2, Ta2O5 together with SiO2 are compared for these 2 types of mirrors. The results of reproducibility of such mirrors and their characterization in terms of reflectivity, losses, surface quality are presented. Comparison of the design with the manufactured mirror is also done.

Paper Details

Date Published: 5 October 2005
PDF: 10 pages
Proc. SPIE 5963, Advances in Optical Thin Films II, 59631P (5 October 2005); doi: 10.1117/12.624771
Show Author Affiliations
Vladimir Pervak, Max-Planck-Institut of Quantum Optics (Germany)
Sergey Naumov, Max-Planck-Institut of Quantum Optics (Germany)
Gabriel Tempea, Femtolasers Produktions GmbH (Austria)
Vlad Yakovlev, Ludwig-Maximilians-Univ. Munchen (Germany)
Ferenc Krausz, Max-Planck-Institut of Quantum Optics (Germany)
Ludwig-Maximilians-Univ. Munchen (Germany)
Alexander Apolonski, Ludwig-Maximilians-Univ. Munchen (Germany)
Institute of Automation and Electrometry, SB RAS (Russia)

Published in SPIE Proceedings Vol. 5963:
Advances in Optical Thin Films II
Claude Amra; Norbert Kaiser; H. Angus Macleod, Editor(s)

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