Beamlet processing is a powerful and flexible approach to the identification of line based structures in data. The processing method is efficient (O(n²)) and also robust to variation in direction of the line continuation. This paper identifies two weaknesses with the current approach: the inability to identify lines at variable intensity, and with variation in width. These are addressed with a simple modification to the process used in selecting the salient beamlets called maxbeam2. This is demonstrated on a line image with variation in signal intensity and line width. The technique appears to correct the above weaknesses with only a small amount of extra processing, and hence make beamlets more generally applicable.

Date Published: 17 September 2005
PDF: 9 pages
Proc. SPIE 5914, Wavelets XI, 591426 (17 September 2005); doi: 10.1117/12.619446

Published in SPIE Proceedings Vol. 5914:
Wavelets XI
Manos Papadakis; Andrew F. Laine; Michael A. Unser, Editor(s)