Share Email Print

Proceedings Paper

EUV laser produced plasma source development for lithography
Author(s): Patrick Hayden D.D.S.; Paul Sheridan; Gerry O'Sullivan; Padraig Dunne; Lynn Gaynor; Nicola Murphy; Anthony Cummings
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

The ideal source of radiation for extreme ultraviolet lithography will produce intense light in a 2% bandwidth centred at 13.5 nm, while the debris and out-of-band radiation produced will be limited to prevent adverse effects to the multilayer optics in the lithography system. In this study ways to optimise plasma sources containing tin are presented. The optimum power density for a tin slab target, with a fixed spotsize, is determined, while the effects of power density on ceramic targets, where tin is present only as a few percent in a target of mainly low Z elements, is also investigated. It has been found that the in-band radiation is increased when the concentration is 5-6%, while the out-of-band radiation is dramatically reduced, due the the low average Z of the target constituents, with conversion effciencies of over 2.5% recorded. The power density needed to optimise the emission from ceramic targets was found to be greater than that required for the pure tin case. In addition, if the target is first irradiated with a pre-pulse, the conversion effciency is seen to increase.

Paper Details

Date Published: 3 June 2005
PDF: 11 pages
Proc. SPIE 5826, Opto-Ireland 2005: Optical Sensing and Spectroscopy, (3 June 2005); doi: 10.1117/12.604853
Show Author Affiliations
Patrick Hayden D.D.S., Univ. College Dublin (Ireland)
Paul Sheridan, Univ. College Dublin (Ireland)
Gerry O'Sullivan, Univ. College Dublin (Ireland)
Padraig Dunne, Univ. College Dublin (Ireland)
Lynn Gaynor, Univ. College Dublin (Ireland)
Nicola Murphy, Univ. College Dublin (Ireland)
Anthony Cummings, Univ. College Dublin (Ireland)

Published in SPIE Proceedings Vol. 5826:
Opto-Ireland 2005: Optical Sensing and Spectroscopy
Gerard D. O'Sullivan; Brian D. MacCraith; Hugh James Byrne; Enda McGlynn; Alan G. Ryder, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?