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Proceedings Paper

The evolution of 4D photoabsorption in tellurium with increasing ionisation
Author(s): Lynn Gaynor; Nicola Murphy; Anthony Cummings; Gerry O'Sullivan; Michael Lysaght; Patrick Hayden; Deirdre Kilbane; John Costello; Eugene Kennedy; Paul van Kampen
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Paper Abstract

The photoabsorption spectra of Te I-Te IV have been recorded and analysed in the XUV spectral region using the dual laser produced plasma technique. Photoexcitation from the 4d subshell is the dominant process in the 35-150 eV energy region. For photon energies between 35-45 eV discrete structure corresponding to 4d-np (n>4) transitions were obtained. Above the 4d ionisation threshold the spectra of Te I-Te III were found to be dominated by a 4d-ef shape resonance, which peaks at ~88 eV in each case. A transfer of oscillator strength from the resonance to discrete 4d-nf (n>3) transitions with increasing ionisation is clearly evident, and the 4d-4f transitions are the strongest features in the Te IV spectrum. Hartee-Fock with configuration interaction and time dependent local density approximation calculations successfully account for this behaviour and permit identification of the discrete features. The use of a prepulse to maximise the brightness of a tungsten continuum emitting plasma was also investigated.

Paper Details

Date Published: 3 June 2005
PDF: 8 pages
Proc. SPIE 5826, Opto-Ireland 2005: Optical Sensing and Spectroscopy, (3 June 2005); doi: 10.1117/12.604836
Show Author Affiliations
Lynn Gaynor, Univ. College Dublin (Ireland)
Nicola Murphy, Univ. College Dublin (Ireland)
Anthony Cummings, Univ. College Dublin (Ireland)
Gerry O'Sullivan, Univ. College Dublin (Ireland)
Michael Lysaght, Univ. College Dublin (Ireland)
Patrick Hayden, Univ. College Dublin (Ireland)
Deirdre Kilbane, Dublin City Univ. (Ireland)
John Costello, Dublin City Univ. (Ireland)
Eugene Kennedy, Dublin City Univ. (Ireland)
Paul van Kampen, Dublin City Univ. (Ireland)

Published in SPIE Proceedings Vol. 5826:
Opto-Ireland 2005: Optical Sensing and Spectroscopy
Gerard D. O'Sullivan; Brian D. MacCraith; Hugh James Byrne; Enda McGlynn; Alan G. Ryder, Editor(s)

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