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Proceedings Paper

Analyzing engineering surface texture using wavelet filter
Author(s): Xiangyang Liu; Jay Raja
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Paper Abstract

Analysis of surface profile generally involves filtering to separate short wavelengths from medium and long wavelengths. This is usually accomplished using digital filters. The wavelet filter is an ideal means to separate the profile into different bands. The space frequency localization and multiscale presentation of different wavelength components is useful in manufacturing process control and in establishing relationship between surface texture and function. The use of wavelet filter to analyze surface is explored in this paper. This paper deals with the evaluation of suitable wavelet basis for analyzing surface texture of machined surfaces using wavelet filter. The multiscale surface features are analyzed using wavelet filter to explore the potential use of wavelet filter in monitoring of manufacturing process and feature detection in engineering surfaces.

Paper Details

Date Published: 23 October 1996
PDF: 8 pages
Proc. SPIE 2825, Wavelet Applications in Signal and Image Processing IV, (23 October 1996); doi: 10.1117/12.255308
Show Author Affiliations
Xiangyang Liu, Univ. of North Carolina/Charlotte (United States)
Jay Raja, Univ. of North Carolina/Charlotte (United States)

Published in SPIE Proceedings Vol. 2825:
Wavelet Applications in Signal and Image Processing IV
Michael A. Unser; Akram Aldroubi; Andrew F. Laine, Editor(s)

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