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Proceedings Paper

Deep-UV standoff Raman spectroscopy
Author(s): Bradley R. Arnold; Eric Bowman; Leslie Scheurer
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Paper Abstract

The availability of high peak-power laser systems capable of delivering intense deep-UV pulses has brought renewed interest in using Raman spectroscopy as both a selective and sensitive analytical technique for stand-off detection. Our approach uses a high power pulsed-laser as the excitation source, specifically the fourth and fifth harmonics of a Nd:YAG laser. One of the hurdles to be overcome to allow deep-UV Raman spectroscopy to become accessible is a direct method of calibrating both the observation frequency and detector response of the spectrograph being used. This report outlines our efforts to understand the photochemical and photophysical consequences of high-peak power excitation of cyclohexane for potential use as a secondary Raman standard in the deep-UV. Evaluation of the photochemical stability, both from multi-photon absorption and in the presence or absence of dissolved oxygen as well as the possibility of (near) resonance enhancement of the C-H stretching region will be described.

Paper Details

Date Published: 13 May 2019
PDF: 8 pages
Proc. SPIE 10983, Next-Generation Spectroscopic Technologies XII, 109830H (13 May 2019); doi: 10.1117/12.2519033
Show Author Affiliations
Bradley R. Arnold, Univ. of Maryland, Baltimore County (United States)
Eric Bowman, Univ. of Maryland, Baltimore County (United States)
Leslie Scheurer, Univ. of Maryland, Baltimore County (United States)


Published in SPIE Proceedings Vol. 10983:
Next-Generation Spectroscopic Technologies XII
Richard A. Crocombe; Luisa T.M. Profeta; Abul K. Azad, Editor(s)

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