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Parametric modeling of surface-distributed-scatterer ensembles for inverse analysis of diffuse-reflectance spectra
Author(s): R. Furstenberg; A. Shabaev; C. A. Kendziora; Y. Kim; R. A. McGill; C. Breshike; S. G. Lambrakos
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Paper Abstract

This study examines using parametric models for inverse analysis of diffuse IR reflectance from particulate materials that are sparsely distributed upon a surface. Parametric models are applied for inverse analysis of simulated spectra, which are calculated using ensembles of reflectance spectra for non-interacting material particles on surfaces, which have specified dielectric response properties and particle-size distributions Simulated reflectance spectra for individual particles upon surfaces, used for prototype inverse analysis, are calculated numerically using a model based on Mie scattering theory, which assumes spherical particles on surfaces. Parametric models of diffuse reflectance spectra provide encoding of dielectric response features for physical interpretation and convenien representation.

Paper Details

Date Published: 14 May 2019
PDF: 8 pages
Proc. SPIE 10986, Algorithms, Technologies, and Applications for Multispectral and Hyperspectral Imagery XXV, 109860Q (14 May 2019); doi: 10.1117/12.2518718
Show Author Affiliations
R. Furstenberg, U.S. Naval Research Lab. (United States)
A. Shabaev, Leidos, Inc. (United States)
C. A. Kendziora, U.S. Naval Research Lab. (United States)
Y. Kim, U.S. Naval Research Lab. (United States)
R. A. McGill, U.S. Naval Research Lab. (United States)
C. Breshike, American Society for Engineering Education (United States)
S. G. Lambrakos, U.S. Naval Research Lab. (United States)


Published in SPIE Proceedings Vol. 10986:
Algorithms, Technologies, and Applications for Multispectral and Hyperspectral Imagery XXV
Miguel Velez-Reyes; David W. Messinger, Editor(s)

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