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Proceedings Paper

Infuence of background trends on noise power spectrum at zero frequency in radiography imaging
Author(s): Eunae Lee; Dong Sik Kim
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Paper Abstract

Noise power spectrum (NPS) at zero frequency can efficiently represent noise properties of radiography detectors. However, accurately and precisely measuring the zero-frequency NPS has difficulties due to several factors. In this paper, such factors are first summarized. Among the factors, we observe unpredictable background trends, which are from unstable detector hardware, and propose a stochastic trend model. This trend inflates the measured NPS at zero frequency depending on the segment size for calculating periodograms. Influences of stochastic trends were first observed with synthetic data. A flat-panel mammography detector, which was based on a-Se photoconductor, was then used to experimentally observe the influences of background trends. We could observe that the inflated value at zero frequency increased as the segment size increased due to the stochastic trend while the true zero-frequency NPS was constant for different segment sizes.

Paper Details

Date Published: 1 March 2019
PDF: 9 pages
Proc. SPIE 10948, Medical Imaging 2019: Physics of Medical Imaging, 1094841 (1 March 2019); doi: 10.1117/12.2512814
Show Author Affiliations
Eunae Lee, Hankuk Univ. of Foreign Studies (Korea, Republic of)
Dong Sik Kim, Hankuk Univ. of Foreign Studies (Korea, Republic of)


Published in SPIE Proceedings Vol. 10948:
Medical Imaging 2019: Physics of Medical Imaging
Taly Gilat Schmidt; Guang-Hong Chen; Hilde Bosmans, Editor(s)

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