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Proceedings Paper

Efficiency analysis of optical schemes for the development of high power laser diode modules
Author(s): Ekaterina I. Kotova; Galina E. Romanova; Helena A. Tsyganok; Maxim A. Odnoblyudov; Vladislav E. Bougrov
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Paper Abstract

Nowadays, fast development of laser based material processing technology and additive manufacturing requires highly efficient high-power laser diode modules with a sub kW level output optical power. Such modules are also used for pumping of solid-state and fiber lasers. One option for obtaining a high-power laser beam is the spatial combination of the radiation of single laser emitters using polarization elements. The second way is manipulation of radiation from stack of laser bars. Both ways have advantages and disadvantages: in the first case, the failure of one emitter is not so crucial, but it is necessary to align a large number of optical elements with high accuracy, which also put stringent requirements to manufacturing tolerance. The second is more compact, but the solution of the thermal problem is much more difficult and bulky complex shapes optical elements emerge. In this paper, several approaches for design of optical scheme of high-power laser diode module are considered. The efficiency of optical schemes and sensitivity to misalignments are analyzed. Recommendations on the choice of schemes depending on necessary power are given.

Paper Details

Date Published: 28 May 2018
PDF: 12 pages
Proc. SPIE 10695, Optical Instrument Science, Technology, and Applications, 106950T (28 May 2018); doi: 10.1117/12.2313293
Show Author Affiliations
Ekaterina I. Kotova, ITMO Univ. (Russian Federation)
Galina E. Romanova, ITMO Univ. (Russian Federation)
Helena A. Tsyganok, ITMO Univ. (Russian Federation)
Maxim A. Odnoblyudov, Peter the Great St. Petersburg Polytechnic Univ. (Russian Federation)
ITMO Univ. (Russian Federation)
Vladislav E. Bougrov, ITMO Univ. (Russian Federation)


Published in SPIE Proceedings Vol. 10695:
Optical Instrument Science, Technology, and Applications
Nils Haverkamp; Richard N. Youngworth, Editor(s)

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