This paper presents a method for determining the degree of misalignment between a LED and its epoxy encapsulation in a simulated environment. The misalignment is determined by analyzing the light emitted by the optoelectronic component and transmitted through a grid of holes. The results obtained are compared with simulated and experimental registers wherein there is no misalignment between the LED and the epoxy but a displacement of the whole optoelectronic component perpendicularly to the observation axis. We prove that the method used allows us to distinguish between the existence of misalignment inside the optoelectronic component and a simple displacement between the optoelectronic component and the observation axis.

Date Published: 24 May 2018
PDF: 15 pages
Proc. SPIE 10677, Unconventional Optical Imaging, 106772I (24 May 2018); doi: 10.1117/12.2306260

Published in SPIE Proceedings Vol. 10677:
Unconventional Optical Imaging
Corinne Fournier; Marc P. Georges; Gabriel Popescu, Editor(s)