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Proceedings Paper

Digital holographic microscopy for the characterization of microelectromechanical systems
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Paper Abstract

Digital holography (DH) in microscopy became an important interferometric tool in optical metrology since when camera sensors reached a higher pixel number with smaller size allowing to acquire more defined images and high-speed computers became able to process such data. Consequently, it was possible the investigation of engineered surfaces on micro-scale, such as micro-electromechanical systems (MEMS) that are micro-devices composed by mechanical elements, electronics, sensors and actuators built in a small volume, realized using different material layers superimposed in various process steps, usually starting from a silicon substrate. In DH is necessary to perform the reconstruction of the wave field by means of numerical tools. This entails a computational burden but offers the possibility of retrieving not only the intensity of the acquired wave field, but also the phase distribution. This work describes the principles of DH and shows some interesting numerical tools suitable to process the holographic images in the field of MEMS. The use of different numerical tools is discussed and illustrated with examples taken from the literature.

Paper Details

Date Published: 26 April 2016
PDF: 6 pages
Proc. SPIE 9890, Optical Micro- and Nanometrology VI, 989002 (26 April 2016); doi: 10.1117/12.2230967
Show Author Affiliations
V. Pagliarulo, Institute of Applied Science and Intelligent Systems "E. Caianiello" CNR (Italy)
L. Miccio, Institute of Applied Science and Intelligent Systems "E. Caianiello" CNR (Italy)
P. Ferraro, Institute of Applied Science and Intelligent Systems "E. Caianiello" CNR (Italy)

Published in SPIE Proceedings Vol. 9890:
Optical Micro- and Nanometrology VI
Christophe Gorecki; Anand Krishna Asundi; Wolfgang Osten, Editor(s)

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