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Proceedings Paper

Functional connectivity during phonemic and semantic verbal fluency test: a multi-channel near infrared spectroscopy study (Conference Presentation)
Author(s): Chun-Jung Huang; Chia-Wei Sun; Po-Han Chou; Ching-Cheng Chuang

Paper Abstract

Verbal fluency tests (VFT) are widely used neuropsychological tests of frontal lobe and have been frequently used in various functional brain mapping studies. There are two versions of VFT based on the type of cue: the letter fluency task (LFT) and the category fluency task (CFT). However, the fundamental aspect of the brain connectivity across spatial regions of the fronto-temporal regions during the VFTs has not been elucidated to date. In this study we hypothesized that different cortical functional connectivity over bilateral fronto-temporal regions can be observed by means of multi-channel fNIRS in the LFT and the CFT respectively. Our results from fNIRS (ETG-4000) showed different patterns of brain functional connectivity consistent with these different cognitive requirements. We demonstrate more brain functional connectivity over frontal and temporal regions during LFT than CFT, and this was in line with previous brain activity studies using fNIRS demonstrating increased frontal and temporal region activation during LFT and CFT and more pronounced frontal activation by the LFT.

Paper Details

Date Published: 26 April 2016
PDF: 1 pages
Proc. SPIE 9690, Clinical and Translational Neurophotonics; Neural Imaging and Sensing; and Optogenetics and Optical Manipulation, 969004 (26 April 2016);
Show Author Affiliations
Chun-Jung Huang, National Chiao Tung Univ. (Taiwan)
Chia-Wei Sun, National Chiao Tung Univ. (Taiwan)
Po-Han Chou, Taichung Veterans General Hospital (Taiwan)
Ching-Cheng Chuang, National Chiao Tung Univ. (Taiwan)

Published in SPIE Proceedings Vol. 9690:
Clinical and Translational Neurophotonics; Neural Imaging and Sensing; and Optogenetics and Optical Manipulation
Steen J. Madsen; E. Duco Jansen; Samarendra K. Mohanty; Nitish V. Thakor; Qingming Luo; Victor X. D. Yang, Editor(s)

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