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Proceedings Paper

Length characterization of a piezoelectric actuator travel with a mode-locked femtosecond laser
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Paper Abstract

The development of absolute distance measurement methods have been enabled by new kind of lasers, special digital signal processing electronics, algorithms and new materials for optics. The phenomenon of the mode-lock of the femtosecond pulse laser increased a number of potential applications with distance surveying where that stable generator of very short and periodically repeated coherent pulses can be used. The main aim of the work is a description of precise measuring method with absolute scale which is able to determine the length of unknown distance with direct traceability to a time standard. The principle of the method is based on a passive optical cavity with mirrors keeping measured distance, in our case a piezoelectric actuator. Time spacing of short femtosecond pulses generated by mode-locked laser is optically phase locked to the cavity free spectral range. A value of the repetition frequency of the laser determines the measured distance. The exact value of the frequency/period of the femtosecond pulse train is detected by a frequency counter. The counting gate of the counter is synchronized with a highly stable oscillator disciplined by H-maser or GPS received signal from atomic clocks. The work shows methods how to overcome problems with dispersive optics in the passive cavity and a way of phase lock of the femtosecond laser repetition rate to free spectral range of the cavity. This measuring technique is demonstrated on length characterization of the piezoelectric transducer which belongs to ultra-precise positioning actuators.

Paper Details

Date Published: 22 June 2015
PDF: 7 pages
Proc. SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, 95254K (22 June 2015); doi: 10.1117/12.2190745
Show Author Affiliations
Lenka Pravdová, Institute of Scientific Instruments of the ASCR, v.v.i. (Czech Republic)
Adam Lešundák, Institute of Scientific Instruments of the ASCR, v.v.i. (Czech Republic)
Václav Hucl, Institute of Scientific Instruments of the ASCR, v.v.i. (Czech Republic)
Martin Čížek, Institute of Scientific Instruments of the ASCR, v.v.i. (Czech Republic)
Břetislav Mikel, Institute of Scientific Instruments of the ASCR, v.v.i. (Czech Republic)
Jan Hrabina, Institute of Scientific Instruments of the ASCR, v.v.i. (Czech Republic)
Šimon Řeřucha, Institute of Scientific Instruments of the ASCR, v.v.i. (Czech Republic)
Ondřej Číp, Institute of Scientific Instruments of the ASCR, v.v.i. (Czech Republic)
Josef Lazar, Institute of Scientific Instruments of the ASCR, v.v.i. (Czech Republic)


Published in SPIE Proceedings Vol. 9525:
Optical Measurement Systems for Industrial Inspection IX
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)

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