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Proceedings Paper

Light scattering and transmission measurement using digital imaging for online analysis of constituents in milk
Author(s): Pranay Jain; Sanjay E. Sarma
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Paper Abstract

Milk is an emulsion of fat globules and casein micelles dispersed in an aqueous medium with dissolved lactose, whey proteins and minerals. Quantification of constituents in milk is important in various stages of the dairy supply chain for proper process control and quality assurance. In field-level applications, spectrophotometric analysis is an economical option due to the low-cost of silicon photodetectors, sensitive to UV/Vis radiation with wavelengths between 300 - 1100 nm. Both absorption and scattering are witnessed as incident UV/Vis radiation interacts with dissolved and dispersed constituents in milk. These effects can in turn be used to characterize the chemical and physical composition of a milk sample. However, in order to simplify analysis, most existing instrument require dilution of samples to avoid effects of multiple scattering. The sample preparation steps are usually expensive, prone to human errors and unsuitable for field-level and online analysis. This paper introduces a novel digital imaging based method of online spectrophotometric measurements on raw milk without any sample preparation. Multiple LEDs of different emission spectra are used as discrete light sources and a digital CMOS camera is used as an image sensor. The extinction characteristic of samples is derived from captured images. The dependence of multiple scattering on power of incident radiation is exploited to quantify scattering. The method has been validated with experiments for response with varying fat concentrations and fat globule sizes. Despite of the presence of multiple scattering, the method is able to unequivocally quantify extinction of incident radiation and relate it to the fat concentrations and globule sizes of samples.

Paper Details

Date Published: 22 June 2015
PDF: 9 pages
Proc. SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, 95254A (22 June 2015); doi: 10.1117/12.2184903
Show Author Affiliations
Pranay Jain, Massachusetts Institute of Technology (United States)
Sanjay E. Sarma, Massachusetts Institute of Technology (United States)

Published in SPIE Proceedings Vol. 9525:
Optical Measurement Systems for Industrial Inspection IX
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)

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