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Proceedings Paper

Temporal modulated deflectometry for painted surface inspection
Author(s): Toru Kurihara; Shigeru Ando; Michihiko Yoshimura
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Paper Abstract

We present a fast method for measuring a curved specular surface defect, which is the temporal modulated deflectometry. The system uses correlation image sensor, which is developed by us. The correlation image sensor(CIS) outputs temporal correlation between intensity signal and reference signal. We moves rectangular pattern to generate temporal signal. There is no need to use sinusoidal intensity pattern for phase measuring deflectometry(PMD) because CIS captures only fundamental frequency component of rectangular wave projected on the screen. Hence, the methodology we proposed has a potential for fast inspection system using only single frame.

Paper Details

Date Published: 22 June 2015
PDF: 6 pages
Proc. SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, 952518 (22 June 2015); doi: 10.1117/12.2184810
Show Author Affiliations
Toru Kurihara, Kochi Univ. of Technology (Japan)
Shigeru Ando, The Univ. of Tokyo (Japan)
Michihiko Yoshimura, Ricoh Elemex Corp. (Japan)

Published in SPIE Proceedings Vol. 9525:
Optical Measurement Systems for Industrial Inspection IX
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)

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