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Proceedings Paper

Multi-scale roughness measurement of cementitious materials using different optical profilers and window resizing analysis
Author(s): Paul C. Montgomery; Fabien Salzenstein; Gianto Gianto; Komla L. Apedo; Nicolas Serres; Christophe Fond; Françoise Feugeas
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Paper Abstract

In the development of new eco-cements for ecologically friendly construction, the porosity, surface structure and chemical nature of the material can influence the bioreceptivity of the surface and the aptitude or not of environmental micro-organisms to form biofilms. Such films are the source of biocontamination that can lead to a degradation in the structural properties over time. Accurate measurement of surface roughness and topography are important to help in the understanding of this interaction. Optical profilers are well adapted to the quantifying of large surface roughness typical of cementitious materials, being more rapid and better able to cope with high roughness compared with stylus and near field probe techniques. But any given surface profiler typically has specific range limits in terms of axial and lateral resolution and field of view, resulting in different roughness values according to the type of optical profiler used. In the present work, unpolished and polished cement paste samples have been measured with two different systems, one using interference microscopy and the other, chromatic confocal sensing. Comparison of the results from both techniques using the method of window re-sizing, more commonly used in tribology, has been used for calculating the average roughness parameters at different scales. The initial results obtained show a successful overlap of the results for the unpolished samples and a slight separation for the polished samples. The validation of the measurements is demonstrated together with a revealing of differences in the measurements on different types of surfaces due to variations in instrument performance.

Paper Details

Date Published: 22 June 2015
PDF: 9 pages
Proc. SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, 95250Z (22 June 2015); doi: 10.1117/12.2184711
Show Author Affiliations
Paul C. Montgomery, ICube Lab., Univ. de Strasbourg, CNRS (France)
Fabien Salzenstein, ICube Lab., Univ. de Strasbourg, CNRS (France)
Gianto Gianto, ICube Lab., Univ. de Strasbourg, CNRS (France)
Komla L. Apedo, ICube Lab., Univ. de Strasbourg, CNRS (France)
Nicolas Serres, ICube Lab., INSA Strasbourg, CNRS (France)
Christophe Fond, ICube Lab., Univ. de Strasbourg, CNRS (France)
Françoise Feugeas, ICube Lab., INSA Strasbourg, CNRS (France)

Published in SPIE Proceedings Vol. 9525:
Optical Measurement Systems for Industrial Inspection IX
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)

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