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Proceedings Paper

Precise angular position measurement of a point source in an optoelectronic system with CCD arrays upon a single readout
Author(s): Evgeny G. Lebedko; Elena N. Zvereva
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Paper Abstract

The purpose of this article is to examine the method of angular position measuring of a point source in a system with a CCD array by means of linear dimension - time slot - code transformation and assessment of the potential accuracy of the method, which is determined by instrumental irremovable random errors of measurement in terms of optimal processing of incoming information with a single reading it with CCD - lines. This work introduces an optoelectronic system circuit with CCD arrays with stretched sensing elements and a point of reference for angular position measuring.

In this case the arrays have images projections of both the reference point source and the target point source, whose angular position is measured with high precision. From the CCD array output the signals arrive at an optimal (or apt) linear filter, and then to the signal peak position detection circuit, which provides the minimum error due to noise impact. Pulse edges, corresponding to the signals maximum, make a time interval filled with high-frequency counting pulses. The number of pulses in this interval will correspond to the measured angular position of the target point source.

In terms of the statistical decision theory this work analyses random errors given the signals spectral function that, in turn, accounts for the transfer function of the optical system and the CCD array as an image analyzer. This article also presents analysis of how measurement accuracy depends on frequency of information readout from the CCD-arrays for different values of signal-to-noise ratio.

Error analysis of the proposed optoelectronic circuits showed that measurements can be made upon a single readout with an accuracy of 0.01 and even 0,001 pixels.

Paper Details

Date Published: 22 June 2015
PDF: 9 pages
Proc. SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, 95253I (22 June 2015); doi: 10.1117/12.2184702
Show Author Affiliations
Evgeny G. Lebedko, ITMO Univ. (Russian Federation)
Elena N. Zvereva, ITMO Univ. (Russian Federation)

Published in SPIE Proceedings Vol. 9525:
Optical Measurement Systems for Industrial Inspection IX
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)

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