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Proceedings Paper

Realistic simulation of camera images of local surface defects in the context of multi-sensor inspection systems
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Paper Abstract

Industrial automation has developed rapidly in the past decades. Customized fabrications and short production time require flexible and high speed inspection systems. Based on these requirements, optical surface inspection systems (OSIS) as efficient and cheap systems for detecting surface defects and none-defects becomes more and more important. To achieve a high recognition rate, huge amounts of image data of defects need to be stored. We introduce a virtual surface defect rendering method to obtain large amount of defect images. In this paper, the ray tracing methods are applied to realistically simulate camera images in OSIS. We used three different bidirectional reflectance distribution function (BRDF) rendering models to describe the scattering between collimated white light and aluminum materials.

Paper Details

Date Published: 22 June 2015
PDF: 6 pages
Proc. SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, 952522 (22 June 2015); doi: 10.1117/12.2184612
Show Author Affiliations
Haiyue Yang, Univ. Stuttgart (Germany)
Tobias Haist, Univ. Stuttgart (Germany)
Marc Gronle, Univ. Stuttgart (Germany)
Wolfgang Osten, Univ. Stuttgart (Germany)

Published in SPIE Proceedings Vol. 9525:
Optical Measurement Systems for Industrial Inspection IX
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)

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