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Proceedings Paper

A Non-scanning Reflection Technique (NRT) for measurements of optical nonlinearities
Author(s): Lin Zhang; Huan Ren; Yi Yang; Quan Yuan; Yong Liu; Zhendong Shi; Hua Ma; Bo Chen; Tingkui Mu
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Paper Abstract

Reflection Z-scan technique allows the measurements of optical nonlinearities of highly absorbing media and surface of transparent media, when transmission Z-scan can not be used. However, Reflection Z-scan needs multiple measurements under strong laser pulse excitation in the scanning process. This can induce damage in the sample in some cases. In this paper, a Non-scanning Reflection Technique (NRT) for measurement of optical nonlinearities is presented to overcome this drawback. Both the nonlinear refraction index and nonlinear absorption coefficient can be determined by measuring the reflection in combination of variable attenuator and an aperture. Based on the Fresnel theory, a theoretical analysis of Non-scanning Reflection Technique (NRT) demonstrates the feasibility of this approach is given and a general expression for the normalized reflectance is derived. In order to illustrate our analytical results, we performed a numerical simulation of the normalized reflectance. Besides, retardance and size of the induced phase plate also make contributions to the normalized reflectance. Moreover, this technique shows a higher sensitivity property compared with traditional reflection Z-scan method.

Paper Details

Date Published: 22 June 2015
PDF: 7 pages
Proc. SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, 95252V (22 June 2015); doi: 10.1117/12.2184525
Show Author Affiliations
Lin Zhang, Research Ctr. of Laser Fusion (China)
Huan Ren, Research Ctr. of Laser Fusion (China)
Yi Yang, Research Ctr. of Laser Fusion (China)
Quan Yuan, Research Ctr. of Laser Fusion (China)
Yong Liu, Research Ctr. of Laser Fusion (China)
Zhendong Shi, Research Ctr. of Laser Fusion (China)
Hua Ma, Research Ctr. of Laser Fusion (China)
Bo Chen, Research Ctr. of Laser Fusion (China)
Tingkui Mu, Xi'an Jiaotong Univ. (China)

Published in SPIE Proceedings Vol. 9525:
Optical Measurement Systems for Industrial Inspection IX
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)

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