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Proceedings Paper

Dynamic goniometer for industrial applications
Author(s): E. M. Ivashchenko; P. A. Pavlov
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Paper Abstract

Due to the increase in production of the angle transducers characterized by high accuracy and high speed of operation [1], there arises a need for metrological control of their function parameters. This challenge can be successfully met involving the dynamic goniometer systems (DG), which consist of the optical angle encoder (OAE) or the ring laser (RL) [2].

The dynamic laser goniometer systems [2], the scale of which is produced by the ring laser, can be successfully used for calibration of the angle encoders. The ring laser operating in the mode of the angle measurement during its rotation has a number of undeniable advantages, such as high degree of uniformity and potential accuracy. However, alongside with the advantages it has several limitations, such as the measurement error increase at low rotation velocity values and instability of the angular scale factor [2]. Integrating the ring laser and the optical angle sensor, the angular scale of which is characterized by a considerably lower uniformity, but a greater degree of stability, provides for the studying of the metrological characteristics of the dynamic goniometer, expansion of the range or its angular operation velocity and its operation in static mode. The articles covers the issues of constructing the dynamic goniometer for calibration of angle encoders as well as the methods and results of its studies.

Paper Details

Date Published: 22 June 2015
PDF: 9 pages
Proc. SPIE 9525, Optical Measurement Systems for Industrial Inspection IX, 95252G (22 June 2015); doi: 10.1117/12.2184027
Show Author Affiliations
E. M. Ivashchenko, Saint-Petersburg Electrotechnical Univ "LETI" (Russian Federation)
P. A. Pavlov, Saint-Petersburg Electrotechnical Univ. "LETI" (Russian Federation)

Published in SPIE Proceedings Vol. 9525:
Optical Measurement Systems for Industrial Inspection IX
Peter Lehmann; Wolfgang Osten; Armando Albertazzi Gonçalves Jr., Editor(s)

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