Share Email Print
cover

Proceedings Paper

Metrological issues related to BRDF measurements around the specular direction in the particular case of glossy surfaces
Author(s): Gaël Obein; Jan Audenaert; Guillaume Ged; Frédéric B. Leloup
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

Among the complete bidirectional reflectance distribution function (BRDF), visual gloss is principally related to physical reflection characteristics located around the specular reflection direction. This particular part of the BRDF is usually referred to as the specular peak. A good starting point for the physical description of gloss could be to measure the reflection properties around this specular peak. Unfortunately, such a characterization is not trivial, since for glossy surfaces the width of the specular peak can become very narrow (typically a full width at half maximum inferior to 0.5° is encountered). In result, new BRDF measurement devices with a very small solid angle of detection are being introduced. Yet, differences in the optical design of BRDF measurement instruments engender different measurement results for the same specimen, complicating direct comparison of the measurement results. This issue is addressed in this paper. By way of example, BRDF measurement results of two samples, one being matte and the other one glossy, obtained by use of two high level goniospectrophotometers with a different optical design, are described. Important discrepancies in the results of the glossy sample are discussed. Finally, luminance maps obtained from renderings with the acquired BRDF data are presented, exemplifying the large visual differences that might be obtained. This stresses the metrological aspects that must be known for using BRDF data. Indeed, the comprehension of parameters affecting the measurement results is an inevitable step towards progress in the metrology of surface gloss, and thus towards a better metrology of appearance in general.

Paper Details

Date Published: 13 March 2015
PDF: 10 pages
Proc. SPIE 9398, Measuring, Modeling, and Reproducing Material Appearance 2015, 93980D (13 March 2015); doi: 10.1117/12.2082518
Show Author Affiliations
Gaël Obein, Conservatoire National des Arts et Métiers (France)
Jan Audenaert, KU Leuven (Belgium)
Guillaume Ged, Conservatoire National des Arts et Métiers (France)
Frédéric B. Leloup, KU Leuven (Belgium)


Published in SPIE Proceedings Vol. 9398:
Measuring, Modeling, and Reproducing Material Appearance 2015
Maria V. Ortiz Segovia; Philipp Urban; Francisco H. Imai, Editor(s)

© SPIE. Terms of Use
Back to Top