Share Email Print
cover

Proceedings Paper

Alignment control optical-electronic system with duplex retroreflectors
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

In this paper, we consider the influence of various factors and interference invariant transformations measuring information on autoreflection schemes alignment control. Theoretical and experimental studies of an error for biprizm scheme. Shown that the main influencing factors are non-linear transformations in optical systems and the impact of the air path. Experimental studies were conducted based on two alignment control opto- electronic systems in which the control element (CE) is configured as one or two corner-cube retroreflectors.

Paper Details

Date Published: 1 May 2014
PDF: 8 pages
Proc. SPIE 9131, Optical Modelling and Design III, 91311X (1 May 2014); doi: 10.1117/12.2052290
Show Author Affiliations
Maksim A. Kleshchenok, National Research Univ. of Information Technologies, Mechanics and Optics (Russian Federation)
Andrey G. Anisimov, National Research Univ. of Information Technologies, Mechanics and Optics (Russian Federation)
Oleg U. Lashmanov, National Research Univ. of Information Technologies, Mechanics and Optics (Russian Federation)
Alexandr N. Timofeev, National Research Univ. of Information Technologies, Mechanics and Optics (Russian Federation)
Valery V. Korotaev, National Research Univ. of Information Technologies, Mechanics and Optics (Russian Federation)


Published in SPIE Proceedings Vol. 9131:
Optical Modelling and Design III
Frank Wyrowski; John T. Sheridan; Jani Tervo; Youri Meuret, Editor(s)

© SPIE. Terms of Use
Back to Top