Share Email Print

Proceedings Paper

Study of the total light flux measurement of wafer-level LED in a multichannel LED measuring system with non-imaging concentrator array
Author(s): Yi-Jiun Chen; Yao-Chi Peng; Yu-Tang Chen; Chen-Chin Cheng; Hoang Yan Lin
Format Member Price Non-Member Price
PDF $17.00 $21.00

Paper Abstract

To raise the speed of characterizing wafer-level LEDs, simultaneous measurement for both electrical and optical properties in parallel is a necessity. A non-imaging concentrator array is designed to concentrate as much light as possible from LEDs for optical characterization of multiple points on the wafer. For the sake of meeting the requirements between the numerical aperture of the sensing fiber and the emitting half-cone angle from a Lambertian source, a reversed angle transformer (RAT) is used in this study. The simulation is conducted using the commercial software LightTools® , based on the Monte-Carlo ray-tracing method. According to the simulation, the entrance port can collect approximately 94% of radiance from a Lambertian source, and the concentration ratio of RAT is approximately 99%. Finally a design prototype is demonstrated in this paper to validate our design.

Paper Details

Date Published: 1 May 2014
PDF: 9 pages
Proc. SPIE 9131, Optical Modelling and Design III, 91311R (1 May 2014); doi: 10.1117/12.2052089
Show Author Affiliations
Yi-Jiun Chen, National Taiwan Univ. (Taiwan)
Yao-Chi Peng, National Taiwan Univ. (Taiwan)
Yu-Tang Chen, Industrial Technology Research Institute (Taiwan)
Chen-Chin Cheng, Industrial Technology Research Institute (Taiwan)
Hoang Yan Lin, National Taiwan Univ. (Taiwan)

Published in SPIE Proceedings Vol. 9131:
Optical Modelling and Design III
Frank Wyrowski; John T. Sheridan; Jani Tervo; Youri Meuret, Editor(s)

© SPIE. Terms of Use
Back to Top
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research
Forgot your username?