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Proceedings Paper

Taking the spectral overlap between excitation and emission spectra of fluorescent materials into account with Monte Carlo simulations
Author(s): Sven Leyre; Jana Ryckaert; Paula Acuna; Jan Audenaert; Youri Meuret; Johan Hofkens; Guy Durinck; Geert Deconinck; Peter Hanselaer
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Paper Abstract

Monte Carlo ray tracing is an important simulation tool in applications where fluorescence is present, e.g. in bio-medical applications and in the design of luminaires and luminescent solar concentrators. A frequently used ray tracing procedure for fluorescence is the ‘dual stage’ approach. In this approach, first, all sources are traced through the system and the rays absorbed in the fluorescent components are stored. Next, the emission from the fluorescent components is traced. This approach does not allow for subsequent re-absorption and re-emission effects in fluorescent materials with a spectral overlap between excitation and emission spectra. In this work, a ‘multi stage’ ray tracing procedure for the simulation of luminescence is presented. Herein, wavelengths are traced from short to long separately and no distinction is made regarding the origin of emission (either a fluorescent component or a source). The presented approach can be easily implemented in existing commercial ray tracing software thus reducing the programming efforts for the new ray tracing algorithm and taking advantage of the strength of the selected ray tracing package concerning the modelling of complex geometrical systems. Both techniques are compared to investigate the influence of the selected ray tracing approach on the efficiency and colour prediction of a remote phosphor LED module.

Paper Details

Date Published: 1 May 2014
PDF: 10 pages
Proc. SPIE 9131, Optical Modelling and Design III, 913103 (1 May 2014); doi: 10.1117/12.2051995
Show Author Affiliations
Sven Leyre, Katholieke Univ. Leuven (Belgium)
Flemish Strategic Initiative on Materials (Belgium)
Jana Ryckaert, Katholieke Univ. Leuven (Belgium)
Paula Acuna, Katholieke Univ. Leuven (Belgium)
Jan Audenaert, Katholieke Univ. Leuven (Belgium)
Youri Meuret, Katholieke Univ. Leuven (Belgium)
Johan Hofkens, Katholieke Univ. Leuven (Belgium)
Guy Durinck, Katholieke Univ. Leuven (Belgium)
Flemish Strategic Initiative on Materials (Belgium)
Geert Deconinck, Katholieke Univ. Leuven (Belgium)
Peter Hanselaer, Katholieke Univ. Leuven (Belgium)
Flemish Strategic Initiative on Materials (Belgium)

Published in SPIE Proceedings Vol. 9131:
Optical Modelling and Design III
Frank Wyrowski; John T. Sheridan; Jani Tervo; Youri Meuret, Editor(s)

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