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Proceedings Paper

High-Q optical nanobeam cavities for label-free sensing
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Paper Abstract

The design, modeling, fabrication, and experimental measurements on optical nanobeam cavities that change resonant frequency in response to changes in the refractive index of the surrounding environment are presented. Nanobeam cavities based on Silicon-On-Insulator (SOI) that work at telecommunication wavelengths (1550 nm) provide an ideal platform for label-free sensing, due to their features of high resonance Q-factors, high sensitivity and capability for integration with silicon CMOS.

Paper Details

Date Published: 3 May 2013
PDF: 8 pages
Proc. SPIE 8774, Optical Sensors 2013, 87740G (3 May 2013); doi: 10.1117/12.2017696
Show Author Affiliations
M. Ghazali A. Rahman, Univ. of Glasgow (United Kingdom)
Philippe Velha, Univ. of Glasgow (United Kingdom)
Richard M. De La Rue, Univ. of Glasgow (United Kingdom)
Nigel P. Johnson, Univ. of Glasgow (United Kingdom)

Published in SPIE Proceedings Vol. 8774:
Optical Sensors 2013
Francesco Baldini; Jiri Homola; Robert A. Lieberman, Editor(s)

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