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11 - 16 October 2020
Conference 11552
Optical Metrology and Inspection for Industrial Applications VII
Conference Committee
Saturday 28 November Show All Abstracts
Session LIVE: Opening Ceremony and SPIE/COS Photonics Asia Plenary Session I

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Presentation(s) are now available for on-demand viewing.
Brain-wide positioning system for brainsmatics (Conference Presentation) (Plenary Presentation) Presentation
Paper 11553-201
Author(s): Qingming Luo, Hainan Univ. (China), HUST-Suzhou Institute for Brainsmatics (China)
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Perovskite LEDs: high efficiency and high brightness (Plenary Presentation) Presentation
Paper 11547-202
Author(s): Jianpu Wang, Nanjing Tech Univ. (China)
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Session LIVE: SPIE/COS Photonics Asia Plenary Session II

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Presentation(s) are now available for on-demand viewing.
Metasurface flat optics: from high-performance components to cameras (Plenary Presentation) Presentation
Paper 11556-203
Author(s): Federico Capasso, Harvard John A. Paulson School of Engineering and Applied Sciences (United States)
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Session LIVE: SPIE/COS Photonics Asia Plenary Session III

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Presentation(s) are now available for on-demand viewing.
Ultrafast molecular dynamics and ultrahigh-resolution spectroscopy using ultrashort intense laser pulses (Plenary Presentation) Presentation
Paper 11544-204
Author(s): Kaoru Yamanouchi, The Univ. of Tokyo (Japan)
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Session 1: Optical Metrology Methods I
Session Chairs:
Sen Han, Univ. of Shanghai for Science and Technology (China) ;
Zonghua Zhang, Hebei Univ. of Technology (China)

Presentations in this session will be available for on-demand viewing through the dates of the SPIE/COS Photonics Asia Digital Forum, 11-16 October 2020.


Precision measurement methods of wavefront error for meter-size planar optical components applied to ICF systems (Invited Paper) Paper Presentation
Paper 11552-1
Author(s): Shijie Liu, Shanghai Institute of Optics and Fine Mechanics (China); Longbo Xu, Nanjing Univ. of Science and Technology (China); Xu Zhang, You Zhou, Qi Lu, Yunbo Bai, Jianda Shao, Shanghai Institute of Optics and Fine Mechanics (China)
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FFT wavefront reconstruction algorithm with periodical extension for lateral shearing interferometry Paper Presentation
Paper 11552-2
Author(s): Peng Li, Feng Tang, Xiangzhao Wang, Shanghai Institute of Optics and Fine Mechanics (China)
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Micro-scale surface metrology using a large scanning range non-contact laser confocal microscope Paper Presentation
Paper 11552-3
Author(s): Shihua Wang, Shangkai Yu, National Metrology Ctr. (Singapore)
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Center extraction method of circular coding target based on radial line fitting of coding ring Presentation
Paper 11552-4
Author(s): Nan Gao, Sen Wang, Zonghua Zhang, Zhaozong Meng, Hebei Univ. of Technology (China)
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Dynamic fringe analysis using GPU assisted root-MUSIC method Paper Presentation
Paper 11552-75
Author(s): Jagadesh Ramaiah, Rajshekhar Gannavarpu, Indian Institute of Technology Kanpur (India)
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Session 2: Optical Metrology Methods II
Session Chairs:
Gerd Ehret, Physikalisch-Technische Bundesanstalt (Germany) ;
Ruipin Chen, Zhejiang Sci-Tech Univ. (China)

Presentations in this session will be available for on-demand viewing through the dates of the SPIE/COS Photonics Asia Digital Forum, 11-16 October 2020.


Deep-learning-enabled fringe projection profilometry (Invited Paper) Presentation
Paper 11552-6
Author(s): Chao Zuo, Nanjing Univ. of Science and Technology (China)
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Fast 3D surface defect detection with fringe projection Paper Presentation
Paper 11552-7
Author(s): Jiaming Qian, Shijie Feng, Yixuan Li, Tianyang Tao, Qian Chen, Chao Zuo, Nanjing Univ. of Science and Technology (China)
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Stereo phase unwrapping method based on feedback projection Paper Presentation
Paper 11552-8
Author(s): Yixuan Li, Jiaming Qian, Shijie Feng, Tianyang Tao, Qian Chen, Chao Zuo, Nanjing Univ. of Science and Technology (China)
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Session 3: Optical Metrology Methods III
Session Chairs:
Chao Zuo, Nanjing Univ. of Science and Technology (China) ;
Fangfang Liu, Shanghai Institute of Measurement and Testing Technology (China)

Presentations in this session will be available for on-demand viewing through the dates of the SPIE/COS Photonics Asia Digital Forum, 11-16 October 2020.


Challenges in the In-situ Deflectometric Measurement of Optical Surfaces (Invited Paper) Presentation
Paper 11552-11
Author(s): Xiangchao Zhang, Zhenqi Niu, Junqiang Ye, Fudan Univ. (China); Shaliang Li, Wanliang Zhao, Shanghai Academy of Spaceflight Technology (China)
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Calibration of rotary encoders with different interfaces by means of laser dynamic goniometer Paper Presentation
Paper 11552-12
Author(s): Petr A. Pavlov, Yuri V. Filatov, Irina B. Zhuravleva, Saint Petersburg Electrotechnical Univ. "LETI" (Russian Federation)
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Optical system design and measurement of freeform surface Paper
Paper 11552-13
Author(s): Huixing Zhang, Quanying Wu, Junliu Fan, Baohua Chen, Yunhai Tang, Suzhou Univ. of Science and Technology (China); Hou Yuwei, Suzhou FOIF Co., Ltd. (China); Bin Chen, Soochow Univ. (China)
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Polarization evolution of a vector optical field in a PT symmetry system Paper Presentation
Paper 11552-15
Author(s): Ju Wen, Gang Yao, Zhejiang Sci-Tech Univ. (China); Yan Wu, Zhejiang Sci-Tech Univ. (Chad, Republic of); Ruipin Chen, Zhejiang Sci-Tech Univ. (China)
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Session 4: Optical Metrology Methods IV
Session Chairs:
Shijie Liu, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences (China) ;
Lianhua Jin, Univ. of Yamanashi (Japan)

Presentations in this session will be available for on-demand viewing through the dates of the SPIE/COS Photonics Asia Digital Forum, 11-16 October 2020.


Study of adjustment influence on the autocollimating null-indicator accuracy (Invited Paper) Paper Presentation
Paper 11552-16
Author(s): Yuri V. Filatov, Maksim S. Nikolaev, Roman A. Larichev, Petr A. Pavlov, Saint Petersburg Electrotechnical Univ. "LETI" (Russian Federation)
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An experimental evaluation method for deformation measurement of large satellite antenna based on photogrammetry Paper Presentation
Paper 11552-17
Author(s): Bolun Zhang, Linhua Yang, Shanping Jiang, Pengsong Zhang, Gaotong Liu, China Academy of Space Technology (China)
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High precision stability measurement of large size structure using dual femtosecond frequency combs ranging system Paper Presentation
Paper 11552-18
Author(s): Chen Fang, Chao Gao, Heng Zhao, Cong Yue, Beijing Institute of Space Mechanics and Electricity (China)
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Large-area, uniform light field generated using a galvo scanning system for bi-directional reflectance distribution function measurement Paper Presentation
Paper 11552-19
Author(s): Yinuo Xu, Yingwei He, National Institute of Metrology (China); Xufeng Jing, China Jiliang Univ. (China); Xiangliang Liu, Yangting Fu, Yingce Wang, Guojin Feng, Houping Wu, Chundi Zheng, Haiyong Gan, National Institute of Metrology (China)
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Investigation of temporally varying fringe pattern defects using machine learning for optical metrology Paper Presentation
Paper 11552-74
Author(s): Aditya Madipadaga, Indian Institute of Technology Kanpur (India); Rajshekhar Gannavarpu, Indian Institute of Technology, Kanpur (India)
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Session 5: Optical Metrology Methods V
Session Chairs:
Shijie Feng, Nanjing Univ. of Science and Technology (China) ;
Yuri Vladimirovich Filatov, Saint Petersburg Electrotechnical Univ. "LETI" (Russian Federation)

Presentations in this session will be available for on-demand viewing through the dates of the SPIE/COS Photonics Asia Digital Forum, 11-16 October 2020.


Optical profilometry of cylindrical openings for transparent objects (Invited Paper) Paper Presentation
Paper 11552-20
Author(s): Lianhua Jin, Takumi Mukai, Univ. of Yamanashi (Japan); Toru Yoshizawa, Non-Profit Organization 3D Associates (Japan)
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Development of a standard device for laser scanner spatial performance calibration Paper Presentation
Paper 11552-21
Author(s): Fangfang Liu, Yu Ren, Shanghai Institute of Measurement and Testing Technology (China)
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Optomechanical simulations of an advanced stitching interferometer set-up for large freeform optics Paper
Paper 11552-22
Author(s): Jan Spichtinger, Michael Schulz, Gerd Ehret, Physikalisch-Technische Bundesanstalt (Germany)
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Simulation research on ring source of Fizeau interferometer Paper Presentation
Paper 11552-23
Author(s): Qiubai Chen, Univ. of Shanghai for Science and Technology (China); Qiyuan Zhang, Suzhou H&L Instruments LLC (China); Shuai Xu, Suzhou Univ. of Science and Technology (China); Yan Wang, Sen Han, Univ. of Shanghai for Science and Technology (China)
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Study of spatial frequency domain imaging technique for turbid media optical property estimation and application Paper Presentation
Paper 11552-24
Author(s): Xiaping Fu, Xu Jiang, Liyu Dai, Yifeng Luo, Zhejiang Sci-Tech Univ. (China)
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Session 6: Optical Metrology Applications I
Session Chairs:
Gerd Ehret, Physikalisch-Technische Bundesanstalt (Germany) ;
Zonghua Zhang, Hebei Univ. of Technology (China)

Presentations in this session will be available for on-demand viewing through the dates of the SPIE/COS Photonics Asia Digital Forum, 11-16 October 2020.


An end-to-end speckle matching network for 3D imaging Paper Presentation
Paper 11552-26
Author(s): Wei Yin, Chao Zuo, Shijie Feng, Tianyang Tao, Qian Chen, Nanjing Univ. of Science and Technology (China)
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Human-computer interactive system development for cloud removal from single images Paper Presentation
Paper 11552-28
Author(s): Feng Wu, Xifang Zhu, Ruxi Xiang, Qingquan Xu, Yang Xu, Qingcheng Sun, Changzhou Institute of Technology (China)
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Session 7: Optical Metrology Applications II
Session Chairs:
Sen Han, Univ. of Shanghai for Science and Technology (China) ;
Liping Yan, Zhejiang Sci-Tech Univ. (China)

Presentations in this session will be available for on-demand viewing through the dates of the SPIE/COS Photonics Asia Digital Forum, 11-16 October 2020.


Learning-based 3D shape measurements with fringe projection (Invited Paper) Presentation
Paper 11552-30
Author(s): Shijie Feng, Qian Chen, Chao Zuo, Nanjing Univ. of Science and Technology (China)
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Turbine blade surface recovery based on photometric stereo Paper Presentation
Paper 11552-32
Author(s): Long Ma, Yuzhe Liu, Xin Pei, Lei Shi, Civil Aviation Univ. of China (China)
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The underwater active imaging detection with linear polarization (Invited Paper) Paper Presentation
Paper 11552-33
Author(s): Qiming Ren, Yanfa Xiang, Ruipin Chen, Zhejiang Sci-Tech Univ. (China)
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Digital method for determining the vitreousity of malt barley Paper Presentation
Paper 11552-34
Author(s): Dmitrii E. Troshkin, Alexandr N. Chertov, Igor V. Baranov, ITMO Univ. (Russian Federation); Darya Y. Mironova, Tatyana V. Meledina, Anastasia V. Trapeznikova, ITMO University (Russian Federation)
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Recent advance on phase measuring deflectometry for obtaining 3D shape of specular surface (Invited Paper) Paper Presentation
Paper 11552-35
Author(s): Zonghua Zhang, Caixia Chang, Xiaohong Liu, Yuemin Wang, Nan Gao, Zhaozong Meng, Hebei Univ. of Technology (China)
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Improved three-dimensional reconstruction model based on coaxial structured light system Paper Presentation
Paper 11552-36
Author(s): Jing Zhang, Bin Luo, LIESMARS, Wuhan Univ. (China); Xin Su, Wuhan Univ. (China); Lu Li, LIESMARS, Wuhan Univ. (China); Beiwen Li, Iowa State Univ. of Science and Technology (United States); Song Zhang, Purdue Univ. (United States); Yajun Wang, LIESMARS, Wuhan Univ. (China)
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A method for judging faults of 3D body scanner based on standard sphere Paper Presentation
Paper 11552-38
Author(s): Yu Ren, Feng Zhang, Fangfang Liu, Yunxia Fu, Shanghai Institute of Measurement and Testing Technology (China)
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Session Post: Poster Session

Presentations in this session will be available for on-demand viewing through the dates of the SPIE/COS Photonics Asia Digital Forum, 11-16 October 2020.


A location error calibration method for multiple probing systems Paper Poster Presentation
Paper 11552-40
Author(s): Sen Zhou, Chongqing Institute of Metrology and Quality Inspection (China); Jian Xu, Tao Lei, Yu Yan, Liu Tong, Chongqing Academy of Metrology and Quality Inspection (China)
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An improved device for the 3D optical scanner calibration and related influence factors on calibrating result Paper Poster Presentation
Paper 11552-41
Author(s): Yi-Kun Xiong, Jian Xu, Sen Zhou, Long Chen, Jun Xiong, Chongqing Institute of Metrology and Quality Inspection (China)
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Structured light fields 3D imaging with temporal phase unwrapping Paper Poster
Paper 11552-42
Author(s): Yate Jiang, Yi Ding, Wei Liu, Wenqing Cheng, Huazhong Univ. of Science and Technology (China)
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Design of control system for optical measuring device Paper Poster
Paper 11552-43
Author(s): Minghui Yu, Sen Han, Univ. of Shanghai for Science and Technology (China)
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Design of wireless measurement and control system for interferometer Paper Poster
Paper 11552-44
Author(s): Sijing Zhang, Sen Han, Univ. of Shanghai for Science and Technology (China)
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Design of multi-wavelength achromatic transmission sphere based on zoom principle Paper Poster
Paper 11552-45
Author(s): Yan Wang, Univ. of Shanghai for Science and Technology (China); Qiyuan Zhang, Suzhou Hui Li Instrument Co., Ltd. (China); Qiubai Chen, Univ. of Shanghai for Science and Technology (China); Shuai Xu, Suzhou Univ. of Science and Technology (China); Sen Han, Univ. of Shanghai for Science and Technology (China)
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Study on phase stability characteristics of optically controlled phased array radar antenna system Paper Poster
Paper 11552-47
Author(s): Huan Liu, Chunyan Wang, Zhiqiang Wang, Hao Sun, Changchun Univ. of Science and Technology (China)
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Comparison measurement of absolute power responsivity of silicon photodetector between He-Ne laser and supercontinuum white light source Paper Poster
Paper 11552-48
Author(s): Nan Xu, Haiyong Gan, Yangyang Wang, Yingwei He, Wende Liu, Ruoduan Sun, Yandong Lin, National Institute of Metrology (China)
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Methods improve micro multiple configurations Paper
Paper 11552-49
Author(s): Hua Liu, Luoyang Electro-optical Equipment Research Institute (China); Mingsuo Li, Ronggang Zhu, Science and Technology on Electro-optic Control Lab. (China), Luoyang Institute of Electro-optical Equipment of AVIC (China); Liwei Zhou, Beijing Institute of Technology (China)
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Comparative research on two methods of straight line extraction based on sub-pixel Paper Poster Presentation
Paper 11552-50
Author(s): Gongqiang Cui, Xiaofei Wang, Hua Fan, Qilu Univ. of Technology (Shandong Academy of Sciences) (China)
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Numerical analysis and simulation optimization design of coplanar waveguide in electro-optic sampling system Paper
Paper 11552-51
Author(s): Jialin Chen, Liqiang Zhao, Beijing Univ. of Chemical Technology (China); Jianwei Li, Chi Chen, Qiming Fan, National Institute of Metrology (China)
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Interferometric testing of cylindrical inner surface Paper Poster
Paper 11552-53
Author(s): Hao Sun, Changchun Univ. of Science and Technology (China); Sen Han, Suzhou H&L Instruments LLC (China); Chunyan Wang, Huan Liu, Changchun Univ. of Science and Technology (China)
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Research of relative spectral responsivity calibration of InGaAs photodetector based on supercontinuum light source Paper Poster
Paper 11552-54
Author(s): Yongjie Lin, Nan Xu, Zhiwei Liu, Yingwei He, Wende Liu, National Institute of Metrology (China); Huaping Gong, China Jiliang Univ. (China)
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A novel absolute phase retrieval method requiring only three projected patterns Paper Poster
Paper 11552-55
Author(s): Lin Fan, Shaohui Zhang, Yao Hu, Qun Hao, Beijing Institute of Technology (China)
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Active stereo vision system with a mechanical projector Paper Poster
Paper 11552-56
Author(s): Yunmei Wang, Shaohui Zhang, Yao Hu, Qun Hao, Beijing Institute of Technology (China)
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Optimization of a frequency comb-based calibration of a tunable laser Paper Poster Presentation
Paper 11552-57
Author(s): Ramzil Galiev, Russian Quantum Ctr. (Russian Federation), M.V. Lomonosov Moscow State Univ. (Russian Federation); Nikita Kondratiev, Valery Lobanov, Russian Quantum Ctr. (Russian Federation); Igor Bilenko, Russian Quantum Ctr. (Russian Federation), M.V. Lomonosov Moscow State Univ. (Russian Federation)
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Laser scattering characteristics of common roads Paper
Paper 11552-60
Author(s): Yuxiang Jiang, Zhenhua Li, Nanjing Univ. of Science and Technology (China)
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Feature identification of non-stochastic surfaces with non-subsampled contourlet transform Paper Poster Presentation
Paper 11552-61
Author(s): Linfu Li, Guizhou Minzu Univ. (China); Jian-Jun Chen, Xinjiang Medical Univ. (China); Hong Chen, ChuanBo Zhang, Guizhou Minzu Univ. (China)
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A new phase unwrapping method based on inner-fringe coding Paper Poster
Paper 11552-63
Author(s): Zhigang Jin, Lei Lu, Henan Univ. of Technology (China); Ke Wu, Central China Normal Univ. (China)
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Evaluation of ranges of thermal imagers on the basis of static parameters Paper Poster
Paper 11552-65
Author(s): Xingrui Jia, Haiyang Wang, Yanpeng Fu, Jing-qian Ming, Ning Jin, Xing Wang, Chun-fen Zhou, Xianhui Ning, Kunming Institute of Physics (China)
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Recent advances in measurement of radiometric aperture area using optical method at NIM Paper Poster
Paper 11552-68
Author(s): Wende Liu, Nan Xu, Yingwei He, Yandong Lin, Haiyong Gan, Xiangliang Liu, Yangting Fu, National Institute of Metrology (China)
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A new spectral responsivity calibration comparison of InGaAs photodiode based on cryogenic radiometer fundamentals at the National Institute of Metrology of China Paper Poster
Paper 11552-69
Author(s): Yingwei He, Haiyong Gan, Wende Liu, Yongjie Lin, Yangyang Wang, Ning Xu, Weiqiang Zhao, Limin Xiong, Nan Xu, Yandong Lin, National Institute of Metrology (China)
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Self-calibration method using the orientation- and scale-covariant features in planar scene Paper Poster Presentation
Paper 11552-71
Author(s): Qingkai Hou, Hu Chen, Zhiyun Zhuang, Fuyin Wang, Yanxin Ma, Qiong Yao, Shuidong Xiong, National Univ. of Defense Technology (China)
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Measurement of interactive matrix and flat-surface calibration of OKO 109-channel deformable mirror using ZYGO-GPI interferometer Paper
Paper 11552-72
Author(s): Xinyang Chen, Chaoyan Wang, Lixin Zheng, Jianqing Cai, Yuanyuan Ding, Shanghai Astronomical Observatory (China)
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Demodulation of fringe patterns corrupted by non uniform intensity variations in dynamics studies Paper Poster Presentation
Paper 11552-73
Author(s): Allaparthi Venkata Satya Vithin, Issac Show, Sreeprasad Ajithaprasad, Gannavarapu Rajshekhar, Indian Institute of Technology Kanpur (India)
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Conference Committee
Conference Chairs
  • Sen Han, Univ. of Shanghai for Science and Technology (China), Suzhou H&L Instruments LLC (China)
  • Gerd Ehret, Physikalisch-Technische Bundesanstalt (Germany)
  • Benyong Chen, Zhejiang Sci-Tech Univ. (China)

Program Committee
Program Committee continued...
  • Qian Kemao, Nanyang Technological Univ. (Singapore)
  • Jaejoong Kwon, SAMSUNG Display Co., Ltd. (Korea, Republic of)
  • Guohai Situ, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences (China)
  • H. Philip Stahl, NASA Marshall Space Flight Ctr. (United States)
  • John C. Stover, The Scatter Works Inc. (United States)
  • Takamasa Suzuki, Niigata Univ. (Japan)
  • Toshitaka Wakayama, Saitama Medical Univ. (Japan)
  • Haoyu Wang, Univ. of Shanghai for Science and Technology (China)
  • Xiangzhao Wang, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences (China)
  • Yajun Wang, Wuhan Univ. (China)
  • Quanying Wu, Suzhou Univ. of Science and Technology (China)
  • Jiangtao Xi, Univ. of Wollongong (Australia)
  • Jing Xu, Tsinghua Univ. (China)
  • Lianxiang Yang, Oakland Univ. (United States)
  • Dawei Zhang, Univ. of Shanghai for Science and Technology (China)
  • Hao Zhang, Tianjin Univ. (China)
  • Qican Zhang, Sichuan Univ. (China)
  • Zonghua Zhang, Hebei Univ. of Technology (China)
  • Ping Zhou, ASML US, Inc. (United States)
  • Ping Zhong, Donghua Univ. (China)
  • Weihu Zhou, Institute of Microelectronics, Chinese Academy of Sciences (China)
  • Chao Zuo, Nanjing Univ. of Science and Technology (China)

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