Introducing Mad City Labs new sample scanning atomic force microscope. Powered by our industry leading closed loop nanopositioners to ensure high resolution performance, true decoupled motion and virtually undetectable out-of-plane motion. The MadAFM™ supports multiple microscopy modes – imaging, electrical, mechanical, magnetic, and force modes – and is controlled by AFMView® control and acquisition software. Among the ease-of-use features are automated calibration and initialization and simple probe exchange. MadAFM™ is a tabletop sized AFM and does not require on-site installation services.
Learn more at SPIE Bios #8430/SPIE Photonics West #3430
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