Myun-Sik Kim received a Master degree on Mechatronics from Gwangju Institute of Science and Technology (GIST), Korea in 2004 and a PhD in Photonics from École Polytechnique Fédérale de Lausanne (EPFL), Switzerland, in 2011.
Since August 2012, he works at SUSS MicroOptics SA (Hauterive, Switzerland) as Head of Metrology team. SUSS MicroOptics is a world’s leading manufacturer of microlenses and microlens arrays. He is a senior member of the SPIE, and a member of the OSA (Optical society of America), EOS (European Optical Society), and OSK (Optical Society of Korea).
His expertise is “interferometry and metrology” and his research interests include interdisciplinary subjects in micro-optical systems, for instance, microlens and its applications, and microspheres’ super-resolution capabilities.
He is the author of a book chapter edited by Prof. Emil Wolf, Progress in Optics volume 58, 2013, 16 peer-reviewed internal journals, 12 SPIE proceedings, and numerous conference presentations.
1. Wavelength-scale physical optics
• Refraction: high NA focused beams
• Diffraction by a single object: the spot of Arago / Babinet’s principle
• Diffraction by a periodic object (gratings): Talbot and Lau effects
• Scattering by a single dielectric sphere: Photonic nanojet
• Solid immersion lens (SIL) from macro-size down to subwavelength-size
• Plasmonic nanostructures: polarimetry or light confinements
• Axial phase shifts and evolutions: Gouy phase anomaly
• Complex light and structured beams: Laguerre-Gauss, Bessel, Mathieu, cosine beams
2. High-resolution optical metrology
• Optical microscopy
• Optical interferometry
• Phase shifting interferometry (PSI)
• High-resolution interference microscope
• Longitudinal-differencial interferometer
• Optical shop testing for wavelength-sclae optical elements