Dr. Jason R. Grenier

Individual Member | Corning Research & Development Corp
Grenier, Jason R.
SPIE Leadership: Retrieving Data, please wait...
SPIE Membership: 9.2 years
SPIE Awards: 2011 Optics & Photonics Education Scholarship | 2010 Optics & Photonics Education Scholarship | 2009 Optics & Photonics Education Scholarship
SPIE Involvement: Retrieving Data, please wait...
Area of Expertise: Ultrafast laser material processing, femtosecond laser microfabrication, Laser processing of glass, 3D waveguide inscription, Integrated optical circuits, co-packaged optics
Websites: Company Website | Company Website
Social Media: LinkedIn
ORCID iD: https://orcid.org/0000-0003-3833-8560
Contact Details:
Sign In to send a private message or view contact details

Profile Summary

Jason R. Grenier received the B.A.Sc. and M.A.Sc. degrees in electrical engineering from the University of Waterloo, Waterloo, ON, Canada and the Ph.D. degree in electrical engineering from the University of Toronto, ON, Canada, in 2016. His doctoral research focused on the ultrafast laser inscription of 3D optical circuits inside optical fibers. He has authored numerous publications and patents in the field of ultrafast laser material processing. Dr. Grenier joined Corning Research and Development Corporation in 2017 and his research interests include the field of 2D and 3D laser material processing to expand the frontiers of novel photonic devices and manufacturing processes


Career Interest/Objective
To advance fundamental understanding, provide technical leadership, and train the next generation of optical scientists & engineers in the field of ultrafast laser material processing, with the aim of developing state-of-the-art manufacturing processes that bring novel technologies to market

Upcoming Presentations

Most Recent | Show All
Retrieving Data, please wait...

Publications

Most Recent | Show All
Retrieving Data, please wait...

Conference Committee Involvement

Most Recent | Show All
Retrieving Data, please wait...

Course Instructor

Most Recent | Show All
Retrieving Data, please wait...
PREMIUM CONTENT
Sign in to read the full article
Create a free SPIE account to get access to
premium articles and original research