Dr. Frederik Blumrich

Innovation Manager at Carl Zeiss SMT GmbH
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SPIE Membership: 1.0 years
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Area of Expertise: EUV mask technology, EUV mask defectivity, EUV defect mitigation, Optical metrology, Particle Image Velocimetry, Close-range photogrammetry
Websites: Company Website
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Profile Summary

Reviewer for Optical Engineering since 2012

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