Dr. Bo Jiang

Research Scientist
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SPIE Membership: 4.0 years
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Area of Expertise: multi-scale image processing, edge detection, image enhancement, real-time parallel image processing on GPU, imaging system modeling and analysis, generic pattern recognition
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Profile Summary

Bo Jiang received the B. S. degree in Information Engineering from Chengdu University of Technology, Chengdu, Sichuan, China, in 2004, the M. S. degree in Communication and Information Engineering from the University of Electronic Science and Technology of China, Chengdu, Sichuan, China, in 2007, and the Ph.D. degree in Electrical and Computer Engineering from Old Dominion University, Norfolk, VA, USA, in 2010.

He was a Researcher at Computational Intelligence & Machine Vision Laboratory in the Electrical and Computer Engineering Department at Old Dominion University in 2010. In 2011, he joined the National Institute of Aerospace, Hampton, VA, as a Research Scholar. He is currently a Research Scientist at the National Institute of Aerospace, Hampton, VA, and works in the Visual Information Processing Lab of the Electromagnetics and Sensors Branch at NASA Langley Research Center, Hampton, VA. His research interests include multi-scale edge detection and image enhancement, imaging system modeling and analysis, generic pattern recognition, and real-time parallel image processing using graphics processing unit.

Dr. Jiang is a member of SPIE.

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