Attend SPIE Optical Metrology

Make plans to be part of the event featuring the latest advances in measurement systems, modeling, videometrics, and inspection.

Join your colleagues in Munich

Join us for six conferences focused on measurement systems, modeling, videometrics, and inspection. Hear the latest research and share your own.

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Event venue:

ICM - International Congress Center Messe München
Messe München GmbH, Messegelände, 81823 München, Germany

Why attend SPIE Optical Metrology?

Research presented at SPIE Optical Metrology

Connect with colleagues

Technical and networking events keep you abreast of the latest research and in touch with leading scientists.

Hear world-class speakers

Listen to top plenary presentations and learn about the latest challenges and innovations

Student Members may qualify for support

SPIE Student Members are encouraged to apply for supplemental travel grants and fee waivers to attend Optical Metrology. Student Members who are presenting authors will be given priority selection, but grants are open to all Student Members.

Attend SPIE Optical Metrology

Join your colleagues in Munich

Event venue:

Why attend SPIE Optical Metrology?

Hear the latest research

Connect with colleagues

Hear world-class speakers

Student Members may qualify for support

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