San Diego Convention Center
    San Diego, California, United States
    11 - 15 August 2019
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    SPIE Optical Engineering + Applications - The premier optical design, engineering, fabrication, and instrumentation conference

    Optical Engineering + Applications

    SPIE Optical Engineering + Applications, the premier conference for the latest developments in optical design and engineering, including photonic devices and applications, x-ray, gamma-ray, and particle technologies, image and signal processing, astronomical optics and instrumentation, remote sensing, and space optical systems.

    Call for Papers PDF - posted by the end of October 
      View list of conferences
     Papers accepted in these areas
     • Optical Design and Systems Engineering
     • Photonic Devices and Applications
     • Advanced Metrology
     • X-Ray, Gamma-Ray, and Particle Technologies
     • Signal, Image, and Data Processing
     • Remote Sensing
     • Atmospheric and Space Optical Systems

    Special Program:

     • Special Program: Optics Education and Outreach

    SPIE conference papers are published in the Proceedings of SPIE and available via the SPIE Digital Library, the world’s largest collection of optics and photonics research.  

    The Proceedings are indexed in Web of Science, Scopus, Ei Compendex, Inspec, Google Scholar, Astrophysical Data System (ADS), DeepDyve, ReadCube, CrossRef, and other scholarly indexes, and are widely accessible to leading research organizations, conference attendees, and individual researchers. 

    2017 Optical Engineering + Applications Executive Organizing Committee:

    Ruyan Guo, The Univ. of Texas at San Antonio (United States)
    Stephen M. Hammel, Space and Naval Warfare Systems Command (United States)
    Allen H.-L. Huang, Univ. of Wisconsin-Madison (United States)
    Ralph B. James, Savannah River National Lab. (United States)
    Ali M. Khounsary, Illinois Institute of Technology (United States)
    José Sasián, College of Optical Sciences, The Univ. of Arizona (United States)
    Oswald H. Siegmund, Univ. of California, Berkeley (United States)
    H. Philip Stahl, NASA Marshall Space Flight Ctr. (United States)
    Alexander M. J. van Eijk, TNO Defence, Security and Safety (Netherlands)
    Shizhuo Yin, The Pennsylvania State Univ. (United States)

    Important Author Dates

    Abstracts Due
    7 February 2018

    Acceptance Notification
    Sent to Contact Author

    16 April 2018

    On-Site Manuscripts Due
    (Conference 10749 Only)
    27 June 2018

    Post-Meeting Manuscripts Due
    (All Other Conferences)
    25 July 2018

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    Optical Engineering

    Journal of Applied Remote Sensing