Interferometry and Structured Light 2024

Post-deadline submissions will be considered for the poster session, or oral session if space becomes available

This long standing and well-attended conference features interferometry, structured light, and and optical metrology techniques and applications. The techniques enable non-contact inspection of a wide range of objects from macro-scale to nano-scale, and surface finishes from super-polished to structured or randomly rough. Applications in research laboratories, industrial manufacturing, and standardization institutes that rely on the precision, reliability, and flexibility of these techniques steer the industry toward new horizons. For example, applications in new technologies such as creating sustainable product using new materials, MEMS/MOEMS, biomedical devices and light weighted segmented mirrors have pushed the field toward ever more challenging new solutions. These new developments have greatly impacted the science of optical measurements and instruments.

Authors with topics related to interferometry, structured light, and optical metrology are encouraged to submit contributions to this conference. This conference is expected to receive 40-60 papers covering the latest advances in areas relating to techniques and applications of interferometry and fringe analysis methods. Recent progress and next-generation developments will be highlighted. Invited talks will be included with regular conference talks and poster presentations. The meeting will encompass 2-3 days and avoid parallel sessions. In addition, sufficient time will be allotted for visiting the poster sessions and exhibits.



Papers are solicited on the following and related topics:

1. Advanced Measurement Techniques:

• Active and real-time measurement systems
• Atom interferometry
• Calibration and standardization methods
• Digital holography and speckle techniques
• Fringe analysis techniques
• Grating and grid (moiré) methods
• Interferometric fiber optic sensors
• Phase measurement techniques
• Polarization and geometric-phase techniques
• Shearing interferometry and other gradient methods
• White light interferometry and optical coherence tomography

2. Industrial Metrology and Quality Control:

• Automotive, aerospace, and other industrial applications
• Automated measurements
• Freeform, mid-spatial frequency, and roughness measurement
• High-speed 3D metrology
• MEMS/MOEMS reliability analysis, assembly, and packaging testing
• Nondestructive testing and failure analysis
• Stress and strain analysis
• Surface profiling
• Thin-film metrology
• X-ray and high-energy optics characterization

3. Biomedical and Life Sciences Applications:

• Bio-interferometry to measure and image cells and tissues
• Biological and pharmaceutical applications
• Nano-metrology
• Optical projection tomography techniques

4. Astronomy and Space Optics:

• Astronomical and adaptive optics through micro optics testing
• Gravitational wave interferometry
• Terahertz techniques and applications

5. Cross-Scale Measurements and Integration:

• Distance and shape measurements across multiple scales
• Interaction between modeling, simulation, and experiments
• Integrated optical interferometry
• Materials, structural analysis, and testing
• Semiconductor wafer inspection, photolithography mask metrology, and inspection

6. Emerging Interdisciplinary Areas:

• High-speed 3D metrology
• Intelligent metrology systems
• Sustainable product metrology
• Machine Learning
• Materials, structural analysis, and testing
• Tunable wavelength, spectral interferometry, and wavelength-dependent methods
• to 1/∞ and beyond.

We will have a "Fringe Art" Competition: Bring your favorite fringe pattern to display.